| MATERIAL |
FORMULA |
STANDARD PURITIES, % |
THEORETICAL DENSITY, g/cm3 |
MELTING POINT, oC |
FABRICATION METHOD* |
|
APPLICATIONS |
| Aluminum-copper |
Al - xCu |
99.999
99.99 |
2.7 |
660 |
1 |
|
Conductor contacts in microcircuits. |
|
| Aluminum-silicon |
Al - xSi |
99.999
99.99 |
2.7 |
660 |
1 |
|
Aluminum-silicon
copper |
Al - xSi - yCu |
99.999
99.99 |
2.7 |
660 |
1 |
|
Chromium-silicon
monoxide |
70 wt. % Cr -
30 wt. % SiO |
99.9 |
4.20 |
— |
2 |
|
Excellent thin film resistors for integrated circuits. |
|
Chromium-silicon
monoxide |
60 wt. % Cr -
40 wt. % SiO |
99.9 |
3.69 |
— |
2 |
|
Chromium-silicon
monoxide |
50 wt. % Cr -
50 wt. % SiO |
99.9 |
3.29 |
— |
2 |
|
Chromium-silicon
monoxide |
x wt. % Cr -
y wt. % SiO |
99.9 |
varies |
varies |
2 |
|
| Cobalt-iron |
xCo - yFe |
99.9 |
varies |
varies |
1 & 2 |
|
Magnetic films. |
|
| Cobalt-nickle |
xCo - yNi |
99.9 |
8.90 |
1475 |
1 & 2 |
|
| Gallium arsenide |
GaAs |
99.999 |
5.3 |
1240 |
2 |
|
Semiconductors. |
|
| Gallium phosphide |
GaP |
99.999 |
4.14 |
1480 |
2 |
|
| Inconel |
78 wt. % Ni -
15 wt. % Cr -
7 wt. % Fe |
99.999 |
8.51 |
1425 |
1 |
|
Good corrosion resistance. Thin film resistance. Good film adherence. |
|
| Indium antimonide |
InSb |
99.999 |
5.8 |
523 |
2 |
|
Semiconductors. |
|
| Indium arsenide |
InAs |
99.999 |
5.66 |
943 |
2 |
|
Masers. Coherent emission from diffused diodes. |
|
| Indium phosphide |
InP |
99.999 |
4.79 |
1058 at 21 atm |
2 |
|
Semiconductors. |
|
| Indium-tin |
xIn - ySn |
99.999 99.99 |
7.3 |
varies |
1 |
|
Oxidize to give transparent, conductive films. |
|
| Manganese-iron |
xMn - yFe |
99.9 |
varies |
varies |
2 |
|
Magnetic films. |
|
| Manganese-nickel |
xMn - yNi |
99.9 |
varies |
varies |
2 |
|
| Nickel-chromium |
x wt. % Ni - y wt. % Cr |
99.9 |
7.96-8.48 |
1340-1675 |
1 & 2 |
|
Thin film resistors. Good adherence on non-metals. Good corrosion resistance. |
|
| Nickel-iron |
81 wt. % Ni - 19 wt. % Fe |
99.9 |
8.00 |
1473 |
1 & 2 |
|
Thin films for magnetic heads. Bubble memory devices. |
|
| Nickel-iron |
xNi - yFe |
99.9 |
varies |
varies |
1 & 2 |
|
| Nickel-titanium |
xNi - yTi |
99.9 |
varies |
varies |
1 & 2 |
|
A "shape memory" alloy. |
|
| Nickel-vanadium |
93 wt. % Ni - 7 wt. % V |
99.7 |
8.60 |
1450 |
1 & 2 |
|
Used in circuits; vanadium renders nickel non-magnetic. |
|
| Niobium-titanium |
xNb - xTi |
99.9 |
varies |
varies |
2 |
|
Proprietary electronic uses. |
|
| Niobium-zirconium |
xNb - xZr |
99.9 |
varies |
varies |
2 |
|
| Permalloy |
79 wt. % Ni -
16.7 wt. % Fe -
4 wt. % Mo -
0.3 wt. % Mn |
99.5 |
8.74 |
— |
1 & 2 |
|
Thin films for magnetic heads. Bubble memory devices. |
|
| Terbium-iron |
xTv - yFe |
99.9 |
varies |
varies |
2 |
|
Magneto-optic, sensitive to light changing flux fields. |
|
| Tungsten-titanium |
90 wt. % W - 10 wt. % Ti |
99.995 (Na<1 ppm) |
14.6 |
1860 |
2 |
|
Diffusion barriers, primarily between Pt silicide contacts and other interconnects. |
|
| Tungsten-titanium |
90 wt. % W - 10 wt. % Ti |
99.9 (Na = 300-500 ppm) |
14.6 |
1860 |
2 |
|
| Tungsten-titanium |
90 wt. % W - 10 wt. % Ti |
99.9 (Na<10 ppm) |
14.6 |
1860 |
2 |
|
| Vanadium-aluminum |
xV-yAl |
99.7 |
varies |
varies |
2 |
|
Proprietary research uses. |
|
| Zirconium-aluminum |
xZr-yAl |
99.7 |
varies |
varies |
2 |
|
Proprietary research uses. |
|