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Metal Alloys and Intermetallics

MATERIAL FORMULA STANDARD
PURITIES, %
THEORETICAL
DENSITY, g/cm3
MELTING
POINT, oC
FABRICATION
METHOD*
   APPLICATIONS
Aluminum-copper Al - xCu 99.999
99.99
2.7 660 1    Conductor contacts in microcircuits.
Aluminum-silicon Al - xSi 99.999
99.99
2.7 660 1
Aluminum-silicon
copper
Al - xSi - yCu 99.999
99.99
2.7 660 1
Chromium-silicon
monoxide
70 wt. % Cr -
30 wt. % SiO
99.9 4.20 2    Excellent thin film resistors for integrated circuits.
Chromium-silicon
monoxide
60 wt. % Cr -
40 wt. % SiO
99.9 3.69 2
Chromium-silicon
monoxide
50 wt. % Cr -
50 wt. % SiO
99.9 3.29 2
Chromium-silicon
monoxide
x wt. % Cr -
y wt. % SiO
99.9 varies varies 2
Cobalt-iron xCo - yFe 99.9 varies varies 1 & 2    Magnetic films.
Cobalt-nickle xCo - yNi 99.9 8.90 1475 1 & 2
Gallium arsenide GaAs 99.999 5.3 1240 2    Semiconductors.
Gallium phosphide GaP 99.999 4.14 1480 2
Inconel 78 wt. % Ni -
15 wt. % Cr -
7 wt. % Fe
99.999 8.51 1425 1    Good corrosion resistance. Thin film resistance. Good film adherence.
Indium antimonide InSb 99.999 5.8 523 2    Semiconductors.
Indium arsenide InAs 99.999 5.66 943 2    Masers. Coherent emission from diffused diodes.
Indium phosphide InP 99.999 4.79 1058 at
21 atm
2    Semiconductors.
Indium-tin xIn - ySn 99.999
99.99
7.3 varies 1    Oxidize to give transparent, conductive films.
Manganese-iron xMn - yFe 99.9 varies varies 2    Magnetic films.
Manganese-nickel xMn - yNi 99.9 varies varies 2
Nickel-chromium x wt. % Ni -
y wt. % Cr
99.9 7.96-8.48 1340-1675 1 & 2    Thin film resistors. Good adherence on non-metals. Good corrosion resistance.
Nickel-iron 81 wt. % Ni -
19 wt. % Fe
99.9 8.00 1473 1 & 2    Thin films for magnetic heads. Bubble memory devices.
Nickel-iron xNi - yFe 99.9 varies varies 1 & 2
Nickel-titanium xNi - yTi 99.9 varies varies 1 & 2    A "shape memory" alloy.
Nickel-vanadium 93 wt. % Ni -
7 wt. % V
99.7 8.60 1450 1 & 2    Used in circuits; vanadium renders nickel non-magnetic.
Niobium-titanium xNb - xTi 99.9 varies varies 2    Proprietary electronic uses.
Niobium-zirconium xNb - xZr 99.9 varies varies 2
Permalloy 79 wt. % Ni -
16.7 wt. % Fe -
4 wt. % Mo -
0.3 wt. % Mn
99.5 8.74 1 & 2    Thin films for magnetic heads. Bubble memory devices.
Terbium-iron xTv - yFe 99.9 varies varies 2    Magneto-optic, sensitive to light changing flux fields.
Tungsten-titanium 90 wt. % W -
10 wt. % Ti
99.995
(Na<1 ppm)
14.6 1860 2    Diffusion barriers, primarily between Pt silicide contacts and other interconnects.
Tungsten-titanium 90 wt. % W -
10 wt. % Ti
99.9
(Na = 300-500 ppm)
14.6 1860 2
Tungsten-titanium 90 wt. % W -
10 wt. % Ti
99.9
(Na<10 ppm)
14.6 1860 2
Vanadium-aluminum xV-yAl 99.7 varies varies 2    Proprietary research uses.
Zirconium-aluminum xZr-yAl 99.7 varies varies 2    Proprietary research uses.

* Fabrication Method: (1) Vacuum or air-vacuum melted, then rolled, cut and machined as required. (2) Hot-pressed or fabricated through special press-sinter process. (3) Vacuum hot-pressed or forged.

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